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CCSU Theses & Dissertations
The discovery by data mining of rogue equipment in the manufacture of semiconductor devices
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The discovery by data mining of rogue equipment in the manufacture of semiconductor devices
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Description
Identifier
Thesis
1905
Author
Barbee, Steven G.
Title
The
discovery
by
data
mining
of
rogue
equipment
in the
manufacture
of
semiconductor
devices
Publisher
Central Connecticut State University
Date
2007
Resource Type
Master's Thesis
Notes
Finding
equipment
causes
of
faulty
devices
in
semiconductor
manufacturing
is
inhibited
by
several
difficulties
which
are
briefly
described
. The
main
problem
area
focused
on here
is
that of
biased
data
mining
methods
. By
judiciously
selecting
two
data
mining
methods
from
IBM's
data
mining
workbench
, the
Intelligent
Miner
for
Data
(IM4D)
,
discovery
of the
known
root
cause
of a
decrease
in
device
parametric
data
from a
manufacturing
line
is
more
likely
to be
obtained
. The
methods
employed
are the
radial
basis
function
network
with
chi-square
ranking
for
feature
selection
followed
by
sequential
one-level
regression
trees
(tree
stumps)
to
provide
rules
. A
graphical
representation
of the
rules
, the
tree
curve
,
is
introduced
which
makes
the
determination
of the
root
cause
visually
easy
. The
value
of this
approach
was
proven
when
it
revealed
the
key
candidate
for a
problem
, in
IBM's
primary
manufacturing
line
,
which
was
later
confirmed
by
traditional
engineering
methods
to be the
root
cause
.
Subject
Data mining
Semiconductors -- Design and construction
Department
Department of Mathematical Sciences
Advisor
Larose, Daniel T.
Type
Text
Digital Format
application/pdf
Language
eng
OCLC number
713734988
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