Data mining; Semiconductors -- Design and construction
Finding equipment causes of faulty devices in semiconductor manufacturing is inhibited by several difficulties which are briefly described. The main problem area focused on here is that of biased data mining methods. By judiciously selecting two...
We present a collection of algorithms which are used to construct Hamiltonian paths
and cycles in hypercube networks with faulty nodes. In graph theoretical terms, the
hypercube is a connected, undirected graph composed of edges and nodes, or...
